Surface Characterization

G. E. McGuire,* M. L. Swanson, N. R. Parikh, S. Simko, P. S. Weiss, J. H. Ferris, R. J. Nemanich, D. R. Chopra, and A. R. Chourasia

Analytical Chemistry 67, 199R (1995).

General Abstract

Reviews of surface characterization have appeared in Analytical Chemistry every two years since 1977 (1-9). During this time, the field has grown significantly in the volume of papers published as well as the number of applications and diversity of surface characterization tools. This review is similar to the last one in this series, being written by multiple authors with specialties in one or more of the broad categories of surface analysis in an attempt to highlight advances in each of these areas. This review begins with literature from January 1993 and ends with literature from October 1994.

Scanning Probe Microscopy Abstract

Proximal Probes

A critical report on surface chemistry applications of scanning tunneling microscopy, atomic force microscopy, and related techniques is presented. This review is taken from papers predominantly published in 1993 and 1994, the years since the previous Analytical Chemistry review (C1). This review is not meant to be a complete bibliography for research using proximal probes. The discussion is limited to applications beyond topographic and morphological characterization or to new proximal probe techniques and methods. There are tow main meetings in the scanning probe microscopy community: the International Conference on Scanning Tunneling Microscopy and the Annual National Symposium of the American Vacuum Society. Both produce proceedings volumes (C2,C3) that contain a plethora of references on proximal probe techniques. Due to the wide accessibility of the proceedings, no further references from these two sources are included.