Patents

(Last Updated On: July 9, 2019)
  1. System for Detecting Threshold Phenomena Associated with and/or Atomic or Molecular Spectra of a SubstanceP. S. Weiss and S. J. Stranick, U. S. Patent Number 5,268,573 (1993). (Tunable Microwave Frequency AC Scanning Tunneling Microscope).
  2. System for Imaging and Detecting Threshold Phenomena Associated with and/or Atomic or Molecular Spectra of a Substance by Reflection of an AC Electrical SignalP. S. Weiss and S. J. Stranick, U. S. Patent Number 5,281,814 (1994). (Tunable Microwave Frequency AC Scanning Tunneling Microscope or Bulk Insulators).
  3. Multiple Source and Detection Frequencies in Detecting Threshold Phenomena Associated with and/or Atomic or Molecular SpectraP. S. Weiss and S. J. Stranick, U. S. Patent Number 5,397,896 (1995). (Tunable Microwave Frequency AC Scanning Tunneling Spectroscopy).
  4. Reading and Writing Stored Information by Means of ElectrochemistryP. S. Weiss, B. G. Willis, and S. J. Stranick, U. S. Patent Number 5,434,842 (1995). (Memory Applications of AC Scanning Tunneling Microscopy).
  5. A System for Analyzing Surfaces of SamplesP. S. Weiss and S. J. Stranick, U. S. Patent Number 5,504,366 (1996). (Instrumental — Tunable Microwave Frequency AC Scanning Tunneling Microscope).
  6. Small Cavity Analytical InstrumentsP. S. Weiss, L. A. Bumm, B. G. Willis, and R. L. Baer, U. S. Patent 5,559,328 (1996). (Small Cavity, Low and Flat Background, Tunable Microwave Frequency AC Scanning Tunneling Microscope).
  7. Multiple Source and Detector Frequencies in Detecting Threshold Phenomena Associated with and/or Atomic or Molecular SpectraP. S. Weiss and S. J. Stranick, U. S. Patent Number 5,581,193 (1996). (Tunable Microwave Frequency AC Scanning Tunneling Spectroscopy).
  8. System for Analyzing Surfaces of SamplesP. S. Weiss and S. J. Stranick, U. S. Patent Number 5,619,035 (1996). (Instrumental — Tunable Microwave Frequency AC Scanning Tunneling Microscope).
  9. Spectroscopy and Mapping of Single Atoms, Molecules, and Surface Features by Difference Frequency Generation with a Scanning Tunneling Microscope or Related InstrumentsP. S. WeissU. S. Patent Number 5,661,301 (1997). (Optical Difference Frequency Generation and Detection AC Scanning Tunneling Microscope).
  10. An Apparatus and Method of Detection Employing an AC Frequency Sensor ArrayP. S. WeissU. S. Patent Number 5,858,666 (1999). (High Resolution Detection Method for Sensor Arrays)
  11. Reading and Writing Stored Information by Means of ElectrochemistryP. S. Weiss, B. G. Willis, and S. J. Stranick, Swiss Patent Number 0650629 (2000). (Memory Applications of AC Scanning Tunneling Microscopy)
  12. Reading and Writing Stored Information by Means of ElectrochemistryP. S. Weiss, B. G. Willis, and S. J. Stranick, German Patent Number 69328364 (2000). (Memory Applications of AC Scanning Tunneling Microscopy)
  13. Reading and Writing Stored Information by Means of ElectrochemistryP. S. Weiss, B. G. Willis, and S. J. Stranick, United Kingdom Patent Number 0650629 (2000). (Memory Applications of AC Scanning Tunneling Microscopy)
  14. Reading and Writing Stored Information by Means of ElectrochemistryP. S. Weiss, B. G. Willis, and S. J. Stranick, European Patent Number 0650629 (2000). (Memory Applications of AC Scanning Tunneling Microscopy)
  15. System for Detecting Atomic or Molecular Spectra of a Substance, and/or Threshold Phenomena Associated with the SameP. S. Weiss and S. J. Stranick, United Kingdom Patent awarded (2002).
  16. System zum Feststellen von Atom- oder Molekularspektren und/oder Damit Verbundenen SchwellenerscheinungenP. S. Weiss and S. J. Stranick, German Patent awarded (2002).
  17. Systeme de Detection du Spectre Atomique ou Moleculaire et/ou des Phenomenes de Seuil AssociesP. S. Weiss and S. J. Stranick, Swiss Patent awarded (2002).
  18. Molecular Computer, J. M. Tour, M. A. Reed, J. M. Seminario, D. L. Allara, and P. S. WeissU. S. Patent Number 6,430,511 (2002).
  19. Difference Frequency Imaging and Spectroscopy to Measure Dopants Using Alternating Current Scanning Tunneling MicroscopyP. S. Weiss and G. S. McCarty, U. S. Patent 6,597,194 (2003).
  20. Chemical Functionalization NanolithographyP. S. Weiss and R. L. Funk, U. S. Patent 6,835,534 (2004).
  21. Molecular Rulers for Scaling Down NanostructuresP. S. Weiss and A. Hatzor, U. S. Patent 7,015,062 (2006).
  22. Gallium Alloy Nanoparticle Synthesis via Self-Assembled Monolayer Formation and Ultrasound, P. S. Weiss, A. M. Andrews, A. L. Bertozzi, and S. J. Osher, U.S. Patent 9,630,161 (2017).
  23. Determining Fluid Reservoir Connectivity Using Nanowire probes, J. N. Hohman and P. S. Weiss, U.S. and Foreign Patents Pending (2017).
  24. Determining Fluid Reservoir Connectivity and Content Using Functionalized Nanowire Probes, P. S. Weiss, A. M. Andrews, A. L. Bertozzi, and S. J. Osher, U.S. and Foreign Patents Pending (2019).
  25. High-throughput system and method for the temporary permeablization of cells, S. J. Jonas, P. S. Weiss, Xu HOU, J. Aizenberg, A. Khademhosseini, U.S. and Foreign Patents Pending (2019).

Other US and foreign patents pending.